Niranjan Khasgiwale

Niranjan Khasgiwale is a vice president in the Imaging and Process Control group at Applied Materials, responsible for real-time measurement and control solutions. He has more than 20 years of marketing experience in the semiconductor equipment industry. Niranjan holds a master’s degree and Ph.D. in materials science from Dartmouth College and Lehigh University respectively, and a B.Tech in metallurgy from the Indian Institute of Technology.

Designing “Eyes” into Process Equipment to Improve Chip Performance and Yield

Metrology allows process engineers to see the results of process steps. Today, driving improvements in chip performance, power and area/cost (PPAC) requires novel architectures and exotic material stacks. This is introducing new sources of atomic-scale variation that can negatively impact chip performance and yield. It is becoming imperative to “watch” the deposition process as it occurs to control variability and deliver repeatable performance.